Instrumented Impact Hammer IH-01-50 - 50N Range

The IH-01-50 is a low-force instrumented impact hammer designed for structural health testing, resonance determination and modal analysis on lightweight structures such as printed circuit boards. Featuring an integrated IEPE piezoelectric force sensor, it provides a high-sensitivity voltage output and is supplied as a complete kit with interchangeable tips for delicate test applications.

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Description

The IH-01-50 is a low-force instrumented impact hammer designed for structural health testing, resonance determination and modal analysis on lightweight structures, including printed circuit boards. With a force range suited to delicate components, it enables controlled excitation without overloading the test structure.

The hammer incorporates an internal IEPE piezoelectric force sensor that outputs a voltage signal directly. Each IH-01-50 is supplied as a complete kit, including a cable and a selection of interchangeable tips to suit different materials and testing requirements.

The IH-01-50 features an M5 Microdot terminating connector. Impact pulse width and frequency response vary depending on the hammer head and tip configuration used, and should be selected and verified based on actual test conditions.

Key specifications

Model	IH-01-50
Sensitivity	100 mV/N
Hammer head weight	15 g
Hammer head diameter	14 mm
Hammer length	130 mm
Output	M5 Microdot
Tips supplied	Soft, medium, hard, aluminium

Design and construction

The IH-01-50 is built around a compact, lightweight hammer body with an integrated IEPE force sensor to support accurate and repeatable low-force impact measurements. Its small mass and geometry make it particularly suitable for sensitive structures where excessive excitation must be avoided.

The M5 Microdot connector supports straightforward integration with vibration analysers and data acquisition systems commonly used for modal and PCB testing.